Thermal Simulation and characterization of GaAs micromachined power sensor microsystems
Burian, E; Pogany, D; Lalinsky, T; Seliger, Norbert; Gornik, E (1997)
Eurosensors XI, 949-952.
A study of backside laser-probe signals in MOSFETs
Seliger, Norbert; Habas, P; Gornik, E (1996)
Microelectronic Engineering.
DOI: 10.1016/0167-9317(95)00329-0
Backside laserprobing of transient heating in power VDMOSFETs
Seliger, Norbert; Habas, P; Koeck, A; Pogany, D; Gornik, E (1996)
ISPS'96, 115-122.
Power Sensor Microsystems Characterization using a contactless optical laser method
Pogany, D; Lalinsky, T; Seliger, Norbert; Kuzmik, J; Habas, P; Hrkut, P; Gornik, E (1996)
ASDAM'96, 201-204.
Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique
Pogany, D; Seliger, Norbert; Lalinsky, T; Kuzmik, J; Habas, P; Hrkut, P; Gornik, E (1996)
THERMINIC'96, 185-190.
Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique
Seliger, Norbert; Habas, P; Gornik, E; G. Baccarani, M (1996)
ESSDERC'96, 847-850.
Modeling and measurements of backside laserprobe signals in MOSFETs
Seliger, Norbert; Habas, P; Gornik, E; H. C. de Graaf, H (1995)
ESSDERC'95, 773-776.
Prof. Dr. techn. Norbert Seliger
Technische Hochschule Rosenheim
Faculty of Engineering Sciences
T +49 (0) 8031 / 805 - 2624 Norbert.Seliger[at]th-rosenheim.de
ORCID iD: 0000-0002-2308-1558