Time-resolved analysis of self-heating in power VDMOSFETs using backside laserprobing

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Titel Time-resolved analysis of self-heating in power VDMOSFETs using backside laserprobing
Medien Solid-State Electronics
Verfasser Prof. Dr. techn. Norbert Seliger, P Habas, D Pogany, E Gornik
Veröffentlichungsdatum 1997
Zitation Seliger, Norbert; Habas, P; Pogany, D; Gornik, E (1997): Time-resolved analysis of self-heating in power VDMOSFETs using backside laserprobing. Solid-State Electronics. DOI: 10.1016/S0038-1101(97)00131-7