Vorschau! Die Detailseite für diese Publikation wurde nicht aktiviert!
Hot-spot measurements and analysis of electro-thermal effects in low-voltage power-MOSFET's
more| Titel | Hot-spot measurements and analysis of electro-thermal effects in low-voltage power-MOSFET's |
|---|---|
| Medien | Microelectronics Reliability |
| Verfasser | A Castellazzi, V Kartal, R Kraus, Prof. Dr. techn. Norbert Seliger, M Honsberg-Riedl, D Schmitt-Landsiedel |
| Veröffentlichungsdatum | 2003 |
| Zitation | Castellazzi, A; Kartal, V; Kraus, R; Seliger, Norbert; Honsberg-Riedl, M; Schmitt-Landsiedel, D (2003): Hot-spot measurements and analysis of electro-thermal effects in low-voltage power-MOSFET's. Microelectronics Reliability. DOI: 10.1016/S0026-2714(03)00319-6 |