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A study of dielectric breakdown of a half-bridge switching cell with substrate integrated 650V GaN dies
more| Titel | A study of dielectric breakdown of a half-bridge switching cell with substrate integrated 650V GaN dies |
|---|---|
| Medien | IEEE INTERNATIONAL WORKSHOP ON INTEGRATED POWER PACKAGING (IWIPP) |
| Verfasser | Eduard Dechant, Prof. Dr. techn. Norbert Seliger, Prof. Dr.-Ing. Ralph Kennel |
| Veröffentlichungsdatum | 2019 |
| Zitation | Dechant, Eduard; Seliger, Norbert; Kennel, Ralph (2019): A study of dielectric breakdown of a half-bridge switching cell with substrate integrated 650V GaN dies. IEEE INTERNATIONAL WORKSHOP ON INTEGRATED POWER PACKAGING (IWIPP). |