Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique

Titel Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique
Medien ESSDERC'96
Verlag Editions Frontieres
Herausgeber G. Baccarani, M. Rudan
Verfasser Prof. Dr. techn. Norbert Seliger, P Habas, E Gornik, M G. Baccarani
Seiten 847-850
Veröffentlichungsdatum 1996
Zitation Seliger, Norbert; Habas, P; Gornik, E; G. Baccarani, M (1996): Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique. ESSDERC'96, 847-850.