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Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress
mehr| Titel | Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress |
|---|---|
| Medien | Microelectronics Reliability |
| Verfasser | C Furbock, M Litzenberger, D Pogany, E Gornik, Prof. Dr. techn. Norbert Seliger, T Muller-Lynch, M Stecher, H Gossner, W Werner |
| Veröffentlichungsdatum | 1999 |
| Zitation | Furbock, C; Litzenberger, M; Pogany, D; Gornik, E; Seliger, Norbert; Muller-Lynch, T; Stecher, M; Gossner, H; Werner, W (1999): Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress. Microelectronics Reliability. DOI: 10.1016/S0026-2714(99)00124-9 |