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Reliability analysis of power MOSFET's with the help of compact models and circuit simulation
mehr| Titel | Reliability analysis of power MOSFET's with the help of compact models and circuit simulation |
|---|---|
| Medien | Microelectronics Reliability |
| Verfasser | A Castellazzi, R Kraus, Prof. Dr. techn. Norbert Seliger, D Schmitt-Landsiedel |
| Veröffentlichungsdatum | 2002 |
| Zitation | Castellazzi, A; Kraus, R; Seliger, Norbert; Schmitt-Landsiedel, D (2002): Reliability analysis of power MOSFET's with the help of compact models and circuit simulation. Microelectronics Reliability. DOI: 10.1016/S0026-2714(02)00198-1 |