Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques

Thalhammer, R; Fuerboeck, C; Seliger, Norbert; Gornik, E; Wachutka, G (1998)

Proc. of MSM'98, 213.

Absorption Heat Pump for Home Retrofit

Spindler, Ulrich (1997)

Gas-Absorptionswärmepumpe für Hausheizungen

Spindler, Ulrich; Bangheri, Andreas (1997)

Pflegesicherung im Vereinigten Königreich

Fieber, Andreas (1997)

, VII, 91 S..

Pflegesicherung in der Republik Irland

Fieber, Andreas (1997)

, V, 68 S..

Paying for long-term domiciliary care: A comparative perspective

Glendinning, C; Schunk, Michaela; Mclaughlin, E (1997)

Ageing and Society 17, 123-140.

A laser beam method for evaluation of thermal time constant in smart power devices

Seliger, Norbert; Pogany, D; Furbock, C; Habas, P; Gornik, E; Stoisiek, M (1997)

Microelectronics Reliability.
DOI: 10.1016/S0026-2714(97)00149-2

Time-resolved analysis of self-heating in power VDMOSFETs using backside laserprobing

Seliger, Norbert; Habas, P; Pogany, D; Gornik, E (1997)

Solid-State Electronics.
DOI: 10.1016/S0038-1101(97)00131-7

A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry

Seliger, Norbert; Pogany, D; Fuerboeck, C; Habas, P; Gornik, E; Stoisiek, M; Grünbacher, H (1997)

Seliger, Norbert; Pogany, D; Fuerboeck, C; Habas, P; Gornik, E; Stoisiek, M...

ESSDERC'97, 372-375.

Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices

N.Seliger, N.Seliger; Fuerboeck, C; Habas, P; Pogany, D; Gornik, E; Seliger, Norbert (1997)

N.Seliger, N.Seliger; Fuerboeck, C; Habas, P; Pogany, D; Gornik, E...

Proceedings of the Seminar Basics and Technology of Electronic Devices, 143-147.

Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik

Fuerboeck, C; Thalhammer, R; Seliger, Norbert; Pogany, D; Deboy, G; Wachutka, G; Gornik, E (1997)

Fuerboeck, C; Thalhammer, R; Seliger, Norbert; Pogany, D; Deboy, G; Wachutka, G...

ÖVE-Schriftenreihe (ISBN 3-85133-010-2) 14, 117-122.

Optical Testing of submicron-technology MOSFETs and bipolar transistors

Pogany, D; Fuerboeck, C; Seliger, Norbert; Habas, P; Gornik, E; Kubicek, S; Decoutere, S; Grünbacher, H (1997)

Pogany, D; Fuerboeck, C; Seliger, Norbert; Habas, P; Gornik, E; Kubicek, S...

ESSDERC'97, 372-375.

Thermal Simulation and characterization of GaAs micromachined power sensor microsystems

Burian, E; Pogany, D; Lalinsky, T; Seliger, Norbert; Gornik, E (1997)

Eurosensors XI, 949-952.

A parameterized pulse shape analysis method for the GALLEX solar neutrino experiment

Altmann, M; Feilitzsch, F; Schanda, Ulrich (1996)

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment 381, 398-412.
DOI: 10.1016/S0168-9002(96)00738-3

Cryogenic particle detectors with superconducting phase transition thermometers

Ferger, P; Colling, P; Bucci, C; Nucciotti, A; Bühler, M; Coopera, S; Feilitzsch, F; Forster, G; Gabutti, A; Höhne, J; Igalson, J; Kellner, E; Loidl, M; Meier, O; Nagel, U; Pröbst, F; Rulofs, A; Schanda, Ulrich; Seidel, W; Sisti, M; Stodolsky, L; Stolovich, A; Zerle, L (1996)

Ferger, P; Colling, P; Bucci, C; Nucciotti, A; Bühler, M; Coopera, S; Feilitzsch, F...

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment 370, 157-159.
DOI: 10.1016/0168-9002(95)01068-8

Energy and active volume calibration of Xe-filled proportional counters in the 1 to 10 keV range

Schanda, Ulrich; Urban, A (1996)

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment 381, 79-85.
DOI: 10.1016/0168-9002(96)00576-1

Status and low background considerations for the CRESST dark matter search

Bühler, M; Zerle, L; Pröbst, F; Rulofs, A; Schanda, Ulrich; Seidel, W; Absmaier, C; Booth, N; Bucci, C; Colling, P; Cooper, S; V.Feilitzsch, F; Ferger, P; Forster, G; Gabutti, A; Höss, C; Höhne, J; Igalson, J; Kellner, E; Koch, Magdalena ; Loidl, M; Meier, O; Nucciotti, A; Nagel, U; V.D. Putte, M; Salmon, G; Sisti, M; Stodolsky, L; Stolovich, A (1996)

Bühler, M; Zerle, L; Pröbst, F; Rulofs, A; Schanda, Ulrich; Seidel, W; Absmaier, C...

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment 370, 237-240.
DOI: 10.1016/0168-9002(95)01095-5

A study of backside laser-probe signals in MOSFETs

Seliger, Norbert; Habas, P; Gornik, E (1996)

Microelectronic Engineering.
DOI: 10.1016/0167-9317(95)00329-0

Backside laserprobing of transient heating in power VDMOSFETs

Seliger, Norbert; Habas, P; Koeck, A; Pogany, D; Gornik, E (1996)

ISPS'96, 115-122.

Power Sensor Microsystems Characterization using a contactless optical laser method

Pogany, D; Lalinsky, T; Seliger, Norbert; Kuzmik, J; Habas, P; Hrkut, P; Gornik, E (1996)

ASDAM'96, 201-204.