High-Temperature Power electronics: Challenges and Opportunities

Wolfgang, E; Seliger, Norbert; Lugert, G; Riepl, T (2002)

Proc. CIPS'02.

Kompakte und hochzuverlaessige Aufbau- und Verbindungstechnik fuer leistungselektronische Systeme am Beispiel Starter Generator

Seliger, Norbert; Rackles, J; Schwarzbauer, H; Wolfgang, E; Bolz, S (2002)

Proc.~Electronic & Communications in Traffic Systems, ECT'02.

Zuverlaessige Leistungselektronik fuer die Automobiltechnik

Wolfgang, E; Lefranc, G; Seliger, Norbert; Berg, H; Licht, T (2002)

ETG-Tagung Bauelemente der Leistungselektronik und ihre Anwendungen, Bad Nauheim.

Is German long-term care insurance a model for the United States?

Schunk, Michaela; Estes, C (2001)

International Journal of Health Services 31, 617-634.
DOI: 10.2190/VE9Q-L54Y-BC90-2WPH

A volumetric optimization of a low pass filter

Gerber, M; Ferreira, JA; Hofsajer, IW; Seliger, Norbert (2001)

IEEE Industry Applications Society Annual Meeting.

A study of heel crack failures in wire bonds under mechanical cycling

Seliger, Norbert; Ramminger, S; Franke, T; Wachutka, G (2000)

Micro Materials, Proceedings.

Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices

Furbock, C; Pogany, D; Litzenberger, M; Gornik, E; Seliger, Norbert; Gossner, H; Muller-Lynch, T; Stecher, M; Werner, W (2000)

Furbock, C; Pogany, D; Litzenberger, M; Gornik, E; Seliger, Norbert; Gossner, H...

Journal of Electrostatics.
DOI: 10.1016/S0304-3886(00)00024-3

Reliability model for Al wire bonds subjected to heel crack failures

Ramminger, S; Seliger, Norbert; Wachutka, G (2000)

Microelectronics Reliability.
DOI: 10.1016/S0026-2714(00)00139-6

Pflegesicherungssysteme im Vereinigten Königreich und in der Republik Irland

Fieber, Andreas (1999)

, XXII, 274 S..

Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices

Pogany, D; Seliger, Norbert; Litzenberger, M; Gossner, H; Stecher, M; Muller-Lynch, T; Werner, W; Gornik, E (1999)

Pogany, D; Seliger, Norbert; Litzenberger, M; Gossner, H; Stecher, M; Muller-Lynch, T...

Microelectronics Reliability.
DOI: 10.1016/S0026-2714(99)00162-6

Interferometric temperature mapping during ESD stress and failure analysis of Smart Power technology ESD protection devices

Furbock, C; Pogany, D; Litzenberger, M; Gornik, E; Seliger, Norbert; Gossner, H; Muller-Lynch, T; Stecher, M; Werner, W (1999)

Furbock, C; Pogany, D; Litzenberger, M; Gornik, E; Seliger, Norbert; Gossner, H...

ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS.
DOI: 10.1109/EOSESD.1999.819067

Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress

Furbock, C; Litzenberger, M; Pogany, D; Gornik, E; Seliger, Norbert; Muller-Lynch, T; Stecher, M; Gossner, H; Werner, W (1999)

Furbock, C; Litzenberger, M; Pogany, D; Gornik, E; Seliger, Norbert; Muller-Lynch, T...

Microelectronics Reliability.
DOI: 10.1016/S0026-2714(99)00124-9

A Differential Backside Laserprober Technique for the Investigation of the Lateral Temperature Distribution in Power Devices

Fuerboeck, C; Thalhammer, R; Litzenberger, M; Seliger, Norbert; Pogany, D; Gornik, E; Wachutka, G (1999)

Fuerboeck, C; Thalhammer, R; Litzenberger, M; Seliger, Norbert; Pogany, D; Gornik, E...

Proc. of ISPSD'99, 193.

Internal Characterisation of IGBTs Using the Backside Laserprober Technique

Fuerboeck, C; Thalhammer, R; Litzenberger, M; Seliger, Norbert; Wachutka, G; Gornik, E (1999)

Fuerboeck, C; Thalhammer, R; Litzenberger, M; Seliger, Norbert; Wachutka, G...

Proc. Seminar Aktuelle Entwicklungen der Mikroelektronik.

Analysis of the temperature evolution from the time resolved thermooptical interferometric measurements with few Fabry-Perot peaks

Pogany, D; Seliger, Norbert; Gornik, E; Stoisiek, M; Lalinsky, T (1998)

Journal of Applied Physics.
DOI: 10.1063/1.368674

Backside laserprober characterization of thermal effects during high current stress in Smart Power ESD protection devices

Furbock, C; Seliger, Norbert; Pogany, D; Litzenberger, M; Gornik, E; Stecher, M; Gossner, H; Werner, W (1998)

Furbock, C; Seliger, Norbert; Pogany, D; Litzenberger, M; Gornik, E; Stecher, M...

International Electron Devices Meeting.
DOI: 10.1109/IEDM.1998.746451

Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation

Thalhammer, R; Furbock, C; Seliger, Norbert; Deboy, G; Gornik, E; Wachutka, G (1998)

ISPSD - PROCEEDINGS OF THE INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS.
DOI: 10.1109/ISPSD.1998.702668

Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique

Pogany, D; Seliger, Norbert; Lalinsky, T; Kuzmik, J; Habas, P; Hrkut, P; Gornik, E (1998)

Microelectronics Journal.
DOI: 10.1016/S0026-2692(97)00057-8

Thermal simulation and characterization of GaAs micromachined power-sensor microsystems

Burian, E; Pogany, D; Lalinsky, T; Seliger, Norbert; Gornik, E (1998)

Sensors and Actuators A: Physical.
DOI: 10.1016/S0924-4247(98)00072-7

Characterisation of Semiconductor Devices by Infrared Laser Interferometry

Seliger, Norbert; Gornik, E; Pogany, D; Fuerboeck, C; Habas, P; Thalhammer, R; Stoisiek, M (1998)

Seliger, Norbert; Gornik, E; Pogany, D; Fuerboeck, C; Habas, P; Thalhammer, R...

E&I Elektrotechnik und Informationstechnik, Sonderheft Trends in der Mikrotechnik, 403.